Using Concurrent and Semi-Concurrent On-Line Testing During HLS: An Adaptable Approach

	This Article
	PDF RSS feed
	Share
	Email this Article to a friend
	Bibliographic References
	ASCII Text BibTex RefWorks Procite/RefMan/Endnote
	Add to:
	Digg Furl Spurl Blink Simpy Google Del.icio.us Y!MyWeb
	Search
	Similar Articles Articles by M. A. Naal Articles by M. Rakotoar Articles by E. Simeu Articles by C. Aktouf

Proceedings of The Eighth IEEE International On-Line Testing Workshop (IOLTW'02)

Using Concurrent and Semi-Concurrent On-Line Testing During HLS: An Adaptable Approach (PDF)

Isle of Bendor, France

July 08-July 10

ISBN: 0-7695-1641-6

	ASCII Text	x
	M. A. Naal, M. Rakotoar, E. Simeu, C. Aktouf, "Using Concurrent and Semi-Concurrent On-Line Testing During HLS: An Adaptable Approach," On-Line Testing Workshop, IEEE International, pp. 184, Proceedings of The Eighth IEEE International On-Line Testing Workshop (IOLTW'02), 2002.

	BibTex	x
	@article{ 10.1109/OLT.2002.1030208, author = {M. A. Naal and M. Rakotoar and E. Simeu and C. Aktouf}, title = {Using Concurrent and Semi-Concurrent On-Line Testing During HLS: An Adaptable Approach}, journal ={On-Line Testing Workshop, IEEE International}, volume = {0}, year = {2002}, isbn = {0-7695-1641-6}, pages = {184}, doi = {http://doi.ieeecomputersociety.org/10.1109/OLT.2002.1030208}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - On-Line Testing Workshop, IEEE International TI - Using Concurrent and Semi-Concurrent On-Line Testing During HLS: An Adaptable Approach SN - 0-7695-1641-6 SP EP A1 - M. A. Naal, A1 - M. Rakotoar, A1 - E. Simeu, A1 - C. Aktouf, PY - 2002 KW - null VL - 0 JA - On-Line Testing Workshop, IEEE International ER -

M. A. Naal, TIMA Laboratory

M. Rakotoar, TIMA Laboratory

E. Simeu, TIMA Laboratory

C. Aktouf, LCIS-ESISAR

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/OLT.2002.1030208

This paper proposes a suitable on-line testing technique during the synthesis of complex electronic structures. On-line testability is addressed by exploiting time redundancy in the scheduled data flow graph. On-line testability constraints are taken into account at the scheduling and allocation tasks. The technique implements non-concurrent; semi-concurrent or fully concurrent on-line tests according to the ability of the synthesized structure.

Citation:

M. A. Naal, M. Rakotoar, E. Simeu, C. Aktouf, "Using Concurrent and Semi-Concurrent On-Line Testing During HLS: An Adaptable Approach," ioltw, pp.184, Proceedings of The Eighth IEEE International On-Line Testing Workshop (IOLTW'02), 2002

Peer Review Notice | Give Us Feedback

Usage of this product signifies your acceptance of the Terms of Use.