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Proceedings of The Eighth IEEE International On-Line Testing Workshop (IOLTW'02)
Learning-Based On-Line Testing in Feedforward Neural Networks
Isle of Bendor, France
July 08-July 10
ISBN: 0-7695-1641-6
Naotake Kamiura, Himeji Institute of Technology
Kazuharu Yamato, Hyogo University
Teijiro Isokawa, Himeji Institute of Technology
Nobuyuki Matsui, Himeji Institute of Technology
Learning-based on-line testing in feedforward neural networks (NNs) is discussed. After the convergence of the ordinary learning, the re-learning employing two sigmoid activation functions per neuron in the last layer of the NN is made. It sets up the range of erroneous potentials produced from the last layer, and enables us to detect faults without extra hardware.
Citation:
Naotake Kamiura, Kazuharu Yamato, Teijiro Isokawa, Nobuyuki Matsui, "Learning-Based On-Line Testing in Feedforward Neural Networks," ioltw, pp.180, Proceedings of The Eighth IEEE International On-Line Testing Workshop (IOLTW'02), 2002
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