Checkers for RF Matching Networks on an Automatic Test Board

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Proceedings of The Eighth IEEE International On-Line Testing Workshop (IOLTW'02)

Isle of Bendor, France

July 08-July 10

ISBN: 0-7695-1641-6

	ASCII Text	x
	Giuseppe Di Gregorio, Maria Grazia La Rosa, Biagio Russo, "Checkers for RF Matching Networks on an Automatic Test Board," On-Line Testing Workshop, IEEE International, pp. 170, Proceedings of The Eighth IEEE International On-Line Testing Workshop (IOLTW'02), 2002.

	BibTex	x
	@article{ 10.1109/OLT.2002.1030202, author = {Giuseppe Di Gregorio and Maria Grazia La Rosa and Biagio Russo}, title = {Checkers for RF Matching Networks on an Automatic Test Board}, journal ={On-Line Testing Workshop, IEEE International}, volume = {0}, year = {2002}, isbn = {0-7695-1641-6}, pages = {170}, doi = {http://doi.ieeecomputersociety.org/10.1109/OLT.2002.1030202}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - On-Line Testing Workshop, IEEE International TI - Checkers for RF Matching Networks on an Automatic Test Board SN - 0-7695-1641-6 SP EP A1 - Giuseppe Di Gregorio, A1 - Maria Grazia La Rosa, A1 - Biagio Russo, PY - 2002 KW - null VL - 0 JA - On-Line Testing Workshop, IEEE International ER -

Giuseppe Di Gregorio, STMicroelectronics

Maria Grazia La Rosa, STMicroelectronics

Biagio Russo, STMicroelectronics

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/OLT.2002.1030202

This paper shows a method to check the RF matching network, used in a RF Test Board for an Automatic Test Environment.

This method is able to measure the performances and the drift of the network with no variation of the circuit used to test the Device under test. The RF test board performance is under control during the testing phase improving the test reliability and the maintenance?s cycle time.

Citation:

Giuseppe Di Gregorio, Maria Grazia La Rosa, Biagio Russo, "Checkers for RF Matching Networks on an Automatic Test Board," ioltw, pp.170, Proceedings of The Eighth IEEE International On-Line Testing Workshop (IOLTW'02), 2002

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