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Proceedings of The Eighth IEEE International On-Line Testing Workshop (IOLTW'02)
BIST-Based Delay-Fault Testing in FPGAs
Isle of Bendor, France
July 08-July 10
ISBN: 0-7695-1641-6
ASCII Text
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Miron Abramovici, Charles Stroud, "BIST-Based Delay-Fault Testing in FPGAs," On-Line Testing Workshop, IEEE International, pp. 131, Proceedings of The Eighth IEEE International On-Line Testing Workshop (IOLTW'02), 2002.
 
 
BibTex
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@article{ 10.1109/OLT.2002.1030195,
author = {Miron Abramovici and Charles Stroud},
title = {BIST-Based Delay-Fault Testing in FPGAs},
journal ={On-Line Testing Workshop, IEEE International},
volume = {0},
year = {2002},
isbn = {0-7695-1641-6},
pages = {131},
doi = {http://doi.ieeecomputersociety.org/10.1109/OLT.2002.1030195},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - On-Line Testing Workshop, IEEE International
TI - BIST-Based Delay-Fault Testing in FPGAs
SN - 0-7695-1641-6
SP
EP
A1 - Miron Abramovici,
A1 - Charles Stroud,
PY - 2002
KW - null
VL - 0
JA - On-Line Testing Workshop, IEEE International
ER -
 
Miron Abramovici, Agere Systems
Charles Stroud, University of North Carolina at Charlotte
We present the first delay-fault testing approach for FPGAs, applicable both for manufacturing and for on-line testing. Our approach is based on BIST, is comprehensive, and does not require expensive ATE. We have successfully implemented this BIST approach on the ORCA 2C series FPGA.
Citation:
Miron Abramovici, Charles Stroud, "BIST-Based Delay-Fault Testing in FPGAs," ioltw, pp.131, Proceedings of The Eighth IEEE International On-Line Testing Workshop (IOLTW'02), 2002
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