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Proceedings of The Eighth IEEE International On-Line Testing Workshop (IOLTW'02)
A BICS for CMOS Opamps by Monitoring the Supply Current Peak
Isle of Bendor, France
July 08-July 10
ISBN: 0-7695-1641-6
J. Font, Universitat Illes Balears
J. Ginard, Universitat Illes Balears
E. Isern, Universitat Illes Balears
M. Roca, Universitat Illes Balears
J. Segura, Universitat Illes Balears
E. García, Universitat Illes Balears
We present a Built-In-Current-Sensor (BICS) based on monitoring the supply current peak of CMOS opamps using the oscillation-test-strategy. The BICS takes a weighed sample of the current through each opamp current branch and monitors the peak value under oscillation. An envelope detector and additional digital circuitry is used to provide a pass/fail flag. Simulation results demonstrate a high defect coverage with a very small impact on the opamp nominal operation.
Citation:
J. Font, J. Ginard, E. Isern, M. Roca, J. Segura, E. García, "A BICS for CMOS Opamps by Monitoring the Supply Current Peak," ioltw, pp.94, Proceedings of The Eighth IEEE International On-Line Testing Workshop (IOLTW'02), 2002
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