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Proceedings of The Eighth IEEE International On-Line Testing Workshop (IOLTW'02)
Coding Scheme for Low Energy Consumption Fault-Tolerant Bus
Isle of Bendor, France
July 08-July 10
ISBN: 0-7695-1641-6
D. Rossi, University of Bologna
V. E. S. van Dijk, Philips Research Laboratories
R. P. Kleihorst, Philips Research Laboratories
A. H. Nieuwland, Philips Research Laboratories
C. Metra, University of Bologna
We address the problem of devising the error correcting code which, if used to encode the information on a very deep submicron (VDSM) bus, allows us to achieve fault-tolerance with the minimal impact on bus power consumption and power-delay product. In particular, we first report the results of an analysis that we performed on power dissipation in VDSM fault-tolerant busses using Hamming single error correcting codes. We show that no power saving is possible by choosing between different optimal Hamming codes with the same redundancy. We then propose a new coding scheme which provides a reduction of the energy consumption and power-delay product of over the 11.5% and 45%, respectively, with respect to the optimal (7,4) Hamming code, for a 0:13\mu m CMOS technology bus.
Citation:
D. Rossi, V. E. S. van Dijk, R. P. Kleihorst, A. H. Nieuwland, C. Metra, "Coding Scheme for Low Energy Consumption Fault-Tolerant Bus," ioltw, pp.8, Proceedings of The Eighth IEEE International On-Line Testing Workshop (IOLTW'02), 2002
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