CMOS Differential and Absolute Thermal Sensors

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Seventh International On-Line Testing Workshop

Taormina, Italy

July 09-July 11

ISBN: 0-7695-1290-9

	ASCII Text	x
	Ashish Syal, Victor Lee, André Ivanov, Josep Altet, "CMOS Differential and Absolute Thermal Sensors," On-Line Testing Workshop, IEEE International, pp. 0127, Seventh International On-Line Testing Workshop, 2001.

	BibTex	x
	@article{ 10.1109/OLT.2001.937832, author = {Ashish Syal and Victor Lee and André Ivanov and Josep Altet}, title = {CMOS Differential and Absolute Thermal Sensors}, journal ={On-Line Testing Workshop, IEEE International}, volume = {0}, year = {2001}, isbn = {0-7695-1290-9}, pages = {0127}, doi = {http://doi.ieeecomputersociety.org/10.1109/OLT.2001.937832}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - On-Line Testing Workshop, IEEE International TI - CMOS Differential and Absolute Thermal Sensors SN - 0-7695-1290-9 SP EP A1 - Ashish Syal, A1 - Victor Lee, A1 - André Ivanov, A1 - Josep Altet, PY - 2001 VL - 0 JA - On-Line Testing Workshop, IEEE International ER -

Ashish Syal, University of British Columbia

Victor Lee, University of British Columbia

André Ivanov, University of British Columbia

Josep Altet, University of British Columbia

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/OLT.2001.937832

Abstract: This paper treats the test of CMOS digital ICs by using the thermal mapping of the silicon surface as a test observable. Two different temperature-sensing strategies are presented. The novel sensors developed are an on-chip CMOS Differential Temperature (DT) sensor and a Proportional to Absolute Temperature (PTAT) sensor. The sensors are small, robust, effective, and operate without affecting the circuit performance. The sensors have been implemented in a standard .18 ?m CMOS technology.

Citation:

Ashish Syal, Victor Lee, André Ivanov, Josep Altet, "CMOS Differential and Absolute Thermal Sensors," ioltw, pp.0127, Seventh International On-Line Testing Workshop, 2001

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