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Seventh International On-Line Testing Workshop
Smart Temperature Sensor for On-Line Monitoring in Automotive Applications
Taormina, Italy
July 09-July 11
ISBN: 0-7695-1290-9
ASCII Text
x 
 
J.L. Merino, S.A. Bota, A. Herms, J. Samitier, E. Cabruja, X. Jordà, M. Vellvehí, J. Bausells, A. Ferré, J. Bigorra, "Smart Temperature Sensor for On-Line Monitoring in Automotive Applications," On-Line Testing Workshop, IEEE International, pp. 0122, Seventh International On-Line Testing Workshop, 2001.
 
 
BibTex
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@article{ 10.1109/OLT.2001.937831,
author = {J.L. Merino and S.A. Bota and A. Herms and J. Samitier and E. Cabruja and X. Jordà and M. Vellvehí and J. Bausells and A. Ferré and J. Bigorra},
title = {Smart Temperature Sensor for On-Line Monitoring in Automotive Applications},
journal ={On-Line Testing Workshop, IEEE International},
volume = {0},
year = {2001},
isbn = {0-7695-1290-9},
pages = {0122},
doi = {http://doi.ieeecomputersociety.org/10.1109/OLT.2001.937831},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - On-Line Testing Workshop, IEEE International
TI - Smart Temperature Sensor for On-Line Monitoring in Automotive Applications
SN - 0-7695-1290-9
SP
EP
A1 - J.L. Merino,
A1 - S.A. Bota,
A1 - A. Herms,
A1 - J. Samitier,
A1 - E. Cabruja,
A1 - X. Jordà,
A1 - M. Vellvehí,
A1 - J. Bausells,
A1 - A. Ferré,
A1 - J. Bigorra,
PY - 2001
VL - 0
JA - On-Line Testing Workshop, IEEE International
ER -
 
J.L. Merino, Universitat de Barcelona
S.A. Bota, Universitat de Barcelona
A. Herms, Universitat de Barcelona
J. Samitier, Universitat de Barcelona
E. Cabruja, Centre Nacional de Microelectr?nica
X. Jordà, Centre Nacional de Microelectr?nica
M. Vellvehí, Centre Nacional de Microelectr?nica
J. Bausells, Centre Nacional de Microelectr?nica
A. Ferré, Lear Automotive EEDS Spain
J. Bigorra, Lear Automotive EEDS Spain
Abstract: This paper presents a system suitable for DfTT (Design for Thermal Testability) purposes that allows temperature monitoring and programmable overtemperature detection implemented in CMOS technology. It has been developed for on-line monitoring in automotive applications. The system includes a temperature sensor, based on the Base-emitter Voltage of a CMOS Lateral Bipolar Transistor, that achieves a non-linearity lower than 0,4 ?C in the range comprised between [-40 ?C, 85 ?C]. The system is compatible with the Boundary Scan protocol. The chip functions are discussed in detail.
Citation:
J.L. Merino, S.A. Bota, A. Herms, J. Samitier, E. Cabruja, X. Jordà, M. Vellvehí, J. Bausells, A. Ferré, J. Bigorra, "Smart Temperature Sensor for On-Line Monitoring in Automotive Applications," ioltw, pp.0122, Seventh International On-Line Testing Workshop, 2001
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