A Compact Built-In Current Sensor for IDDQ Testing

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6th IEEE International On-Line Testing Workshop (IOLTW)

Palma de Mallorca, Spain

July 03-July 05

ISBN: 0-7695-0646-1

	ASCII Text	x
	Y. Tsiatouhas, Th. Haniotakis, D. Nikolos, "A Compact Built-In Current Sensor for IDDQ Testing," On-Line Testing Workshop, IEEE International, pp. 95, 6th IEEE International On-Line Testing Workshop (IOLTW), 2000.

	BibTex	x
	@article{ 10.1109/OLT.2000.856619, author = {Y. Tsiatouhas and Th. Haniotakis and D. Nikolos}, title = {A Compact Built-In Current Sensor for IDDQ Testing}, journal ={On-Line Testing Workshop, IEEE International}, volume = {0}, year = {2000}, isbn = {0-7695-0646-1}, pages = {95}, doi = {http://doi.ieeecomputersociety.org/10.1109/OLT.2000.856619}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - On-Line Testing Workshop, IEEE International TI - A Compact Built-In Current Sensor for IDDQ Testing SN - 0-7695-0646-1 SP EP A1 - Y. Tsiatouhas, A1 - Th. Haniotakis, A1 - D. Nikolos, PY - 2000 KW - Design for testability KW - DFT KW - Built in current sensors KW - BICS KW - IDDQ testing KW - Current monitoring KW - Bridging and Stuck-on fault testability VL - 0 JA - On-Line Testing Workshop, IEEE International ER -

Y. Tsiatouhas, University of Patras and Integrated Systems Development S.A.

Th. Haniotakis, University of Patras

D. Nikolos, University of Patras

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/OLT.2000.856619

In this paper a simple to implement, compact, build-in current sensor for IDDQ testing of CMOS VLSI circuits based on current mirroring techniques is proposed. This sensor can attain small detection times and can be used for both on-line and off-line IDDQ testing.

Index Terms:

Design for testability, DFT, Built in current sensors, BICS, IDDQ testing, Current monitoring, Bridging and Stuck-on fault testability

Citation:

Y. Tsiatouhas, Th. Haniotakis, D. Nikolos, "A Compact Built-In Current Sensor for IDDQ Testing," ioltw, pp.95, 6th IEEE International On-Line Testing Workshop (IOLTW), 2000

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