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6th IEEE International On-Line Testing Workshop (IOLTW)
Transient Bitflip Injection in Microprocessor Embedded Applications
Palma de Mallorca, Spain
July 03-July 05
ISBN: 0-7695-0646-1
ASCII Text
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R. Velazco, S. Rezgui, "Transient Bitflip Injection in Microprocessor Embedded Applications," On-Line Testing Workshop, IEEE International, pp. 80, 6th IEEE International On-Line Testing Workshop (IOLTW), 2000.
 
 
BibTex
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@article{ 10.1109/OLT.2000.856616,
author = {R. Velazco and S. Rezgui},
title = {Transient Bitflip Injection in Microprocessor Embedded Applications},
journal ={On-Line Testing Workshop, IEEE International},
volume = {0},
year = {2000},
isbn = {0-7695-0646-1},
pages = {80},
doi = {http://doi.ieeecomputersociety.org/10.1109/OLT.2000.856616},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - On-Line Testing Workshop, IEEE International
TI - Transient Bitflip Injection in Microprocessor Embedded Applications
SN - 0-7695-0646-1
SP
EP
A1 - R. Velazco,
A1 - S. Rezgui,
PY - 2000
VL - 0
JA - On-Line Testing Workshop, IEEE International
ER -
 
R. Velazco, TIMA Laboratory
S. Rezgui, TIMA Laboratory
In this paper is investigated a new methodology for transient bitflip injection, randomly in time and location, in microprocessor-based digital architectures. Experimental results performed on two different architectures illustrate the potentialities of this new strategy.
Citation:
R. Velazco, S. Rezgui, "Transient Bitflip Injection in Microprocessor Embedded Applications," ioltw, pp.80, 6th IEEE International On-Line Testing Workshop (IOLTW), 2000
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