An Overview of the Applications of a Pulsed Laser System for SEU Testing

I
IOLTW
2000
6th IEEE International On-Line Testing Workshop (IOLTW)
Abstract - An Overview of the Applications of a Pulsed Laser System for SEU Testing

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6th IEEE International On-Line Testing Workshop (IOLTW)

Palma de Mallorca, Spain

July 03-July 05

ISBN: 0-7695-0646-1

	ASCII Text	x
	V. Pouget, P. Fouillat, D. Lewis, H. Lapuyade, L. Sarger, F.M. Roche, S. Duzellier, R. Ecoffet, "An Overview of the Applications of a Pulsed Laser System for SEU Testing," On-Line Testing Workshop, IEEE International, pp. 52, 6th IEEE International On-Line Testing Workshop (IOLTW), 2000.

	BibTex	x
	@article{ 10.1109/OLT.2000.856612, author = {V. Pouget and P. Fouillat and D. Lewis and H. Lapuyade and L. Sarger and F.M. Roche and S. Duzellier and R. Ecoffet}, title = {An Overview of the Applications of a Pulsed Laser System for SEU Testing}, journal ={On-Line Testing Workshop, IEEE International}, volume = {0}, year = {2000}, isbn = {0-7695-0646-1}, pages = {52}, doi = {http://doi.ieeecomputersociety.org/10.1109/OLT.2000.856612}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - On-Line Testing Workshop, IEEE International TI - An Overview of the Applications of a Pulsed Laser System for SEU Testing SN - 0-7695-0646-1 SP EP A1 - V. Pouget, A1 - P. Fouillat, A1 - D. Lewis, A1 - H. Lapuyade, A1 - L. Sarger, A1 - F.M. Roche, A1 - S. Duzellier, A1 - R. Ecoffet, PY - 2000 VL - 0 JA - On-Line Testing Workshop, IEEE International ER -

V. Pouget, Universit? Bordeaux 1

P. Fouillat, Universit? Bordeaux 1

D. Lewis, Universit? Bordeaux 1

H. Lapuyade, Universit? Bordeaux 1

L. Sarger, Universit? Bordeaux 1

F.M. Roche, Universit? Montpellier II

S. Duzellier, ONERA-DESP

R. Ecoffet, CNES

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/OLT.2000.856612

This paper presents several recent results concerning single-event upset testing with a pulsed laser. It includes sensitivity mapping of a test SRAM cell, slave-induced upset in a flip-flop, MBU mapping of a 16 Mbit DRAM, and on-line testing of a sequencer-counter.

Citation:

V. Pouget, P. Fouillat, D. Lewis, H. Lapuyade, L. Sarger, F.M. Roche, S. Duzellier, R. Ecoffet, "An Overview of the Applications of a Pulsed Laser System for SEU Testing," ioltw, pp.52, 6th IEEE International On-Line Testing Workshop (IOLTW), 2000

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