6th IEEE International On-Line Testing Workshop (IOLTW) A Crosstalk Sensor Implementation for Measuring Interferences in Digital CMOS VLSI Circuits Palma de Mallorca, Spain July 03-July 05 ISBN: 0-7695-0646-1
This paper presents an approach for measuring crosstalk interference in digital CMOS VLSI circuits. The crosstalk sensor has been implemented in 0.8um AMS (Austria Mikro Systeme) technology and its design is based on NOR and NAND RS latches. The interference is produced by an up (down) transition in an affecting line. The crosstalk sensor is designed to measure crosstalk interference amplitude produced by capacitive coupling between long metal lines. The sensor is programmable for measuring some ranges of crosstalk amplitude. The sensor design is based on the dynamic behavior of basic NOR and NAND gates depending on the MOS transistor sizes.
Index Terms:
Crosstalk, VLSI, CMOS, Sensor, Digital
Citation:
J.A. Sainz, R. Muñoz, J.A. Maiz, L.A. Aguado, M. Roca, "A Crosstalk Sensor Implementation for Measuring Interferences in Digital CMOS VLSI Circuits," ioltw, pp.45, 6th IEEE International On-Line Testing Workshop (IOLTW), 2000 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||