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6th IEEE International On-Line Testing Workshop (IOLTW)
Improving On-Line BIST-Based Diagnosis for Roving STARs
Palma de Mallorca, Spain
July 03-July 05
ISBN: 0-7695-0646-1
Miron Abramovici, Bell Labs - Lucent Technologies
Charles Stroud, University of Kentucky
Brandon Skaggs, University of Kentucky
John Emmert, University of Kentucky
We present improvements to our on-line BIST-based diagnosis technique originally used in the roving STARs approach [1]. The enhanced technique starts with a new method of analyzing the BIST results, and employs the original divide-and-conquer method as a second phase only when the first phase fails or it does not achieve maximum diagnostic resolution. The combined technique significantly reduces the diagnosis time, improves the resolution in several cases, and requires less fault-free resources.
Index Terms:
on-line testing and diagnosis, FPGA test and diagnosis
Citation:
Miron Abramovici, Charles Stroud, Brandon Skaggs, John Emmert, "Improving On-Line BIST-Based Diagnosis for Roving STARs," ioltw, pp.31, 6th IEEE International On-Line Testing Workshop (IOLTW), 2000
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