On Combining Fault Classification and Error Propagation Analysis in RT-Level Dependability Evaluation

I
IOLTS
2004
International On-Line Testing Symposium, 10th IEEE (IOLTS'04)
Abstract - On Combining Fault Classification and Error Propagation Analysis in RT-Level Dependability Evaluation

	This Article
	Subscribers, please Login Purchase article: $19 PDF IEEE Xplore Subscribers RSS feed
	Share
	Email this Article to a friend
	Bibliographic References
	ASCII Text BibTex RefWorks Procite/RefMan
	Add to:
	Digg Furl Spurl Blink Simpy Google Del.icio.us Y!MyWeb
	Search
	Similar Articles Articles by A. Ammari Articles by K. Hadjiat Articles by R. Leveugle

International On-Line Testing Symposium, 10th IEEE (IOLTS'04)

Funchal, Madeira Island, Portugal

July 12-July 14

ISBN: 0-7695-2180-0

	ASCII Text	x
	A. Ammari, K. Hadjiat, R. Leveugle, "On Combining Fault Classification and Error Propagation Analysis in RT-Level Dependability Evaluation," On-Line Testing Symposium, IEEE International, pp. 227, International On-Line Testing Symposium, 10th IEEE (IOLTS'04), 2004.

	BibTex	x
	@article{ 10.1109/OLT.2004.1319692, author = {A. Ammari and K. Hadjiat and R. Leveugle}, title = {On Combining Fault Classification and Error Propagation Analysis in RT-Level Dependability Evaluation}, journal ={On-Line Testing Symposium, IEEE International}, volume = {0}, year = {2004}, isbn = {0-7695-2180-0}, pages = {227}, doi = {http://doi.ieeecomputersociety.org/10.1109/OLT.2004.1319692}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - On-Line Testing Symposium, IEEE International TI - On Combining Fault Classification and Error Propagation Analysis in RT-Level Dependability Evaluation SN - 0-7695-2180-0 SP EP A1 - A. Ammari, A1 - K. Hadjiat, A1 - R. Leveugle, PY - 2004 KW - null VL - 0 JA - On-Line Testing Symposium, IEEE International ER -

A. Ammari, TIMA Laboratory, France

K. Hadjiat, TIMA Laboratory, France

R. Leveugle, TIMA Laboratory, France

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/OLT.2004.1319692

Early analysis of the functional impact of faults aims either at classifying the faults according to their main potential effect, or at analyzing more in depth the error propagation paths in the circuit. This paper presents the results of extensive SEU-like fault injections performed on a VHDL model of the 8051 micro-controller. The advantage of combining the two types of analyses and the impact of the workload are discussed.

Citation:

A. Ammari, K. Hadjiat, R. Leveugle, "On Combining Fault Classification and Error Propagation Analysis in RT-Level Dependability Evaluation," iolts, pp.227, International On-Line Testing Symposium, 10th IEEE (IOLTS'04), 2004

Peer Review Notice | Give Us Feedback

Usage of this product signifies your acceptance of the Terms of Use.