An Efficient BIST scheme for High-Speed Adders

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	Similar Articles Articles by D. G. Nikolos Articles by D. Nikolos Articles by H. T. Vergos Articles by C. Efstathiou

9th IEEE International On-Line Testing Symposium

Kos Island, Greece

July 07-July 09

ISBN: 0-7695-1968-7

	ASCII Text	x
	D. G. Nikolos, D. Nikolos, H. T. Vergos, C. Efstathiou, "An Efficient BIST scheme for High-Speed Adders," IEEE International On-Line Testing Symposium, pp. 89, 9th IEEE International On-Line Testing Symposium, 2003.

	BibTex	x
	@article{ 10.1109/OLT.2003.1214372, author = {D. G. Nikolos and D. Nikolos and H. T. Vergos and C. Efstathiou}, title = {An Efficient BIST scheme for High-Speed Adders}, journal ={IEEE International On-Line Testing Symposium}, volume = {0}, year = {2003}, isbn = {0-7695-1968-7}, pages = {89}, doi = {http://doi.ieeecomputersociety.org/10.1109/OLT.2003.1214372}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - IEEE International On-Line Testing Symposium TI - An Efficient BIST scheme for High-Speed Adders SN - 0-7695-1968-7 SP EP A1 - D. G. Nikolos, A1 - D. Nikolos, A1 - H. T. Vergos, A1 - C. Efstathiou, PY - 2003 KW - null VL - 0 JA - IEEE International On-Line Testing Symposium ER -

D. G. Nikolos, University of Partas

D. Nikolos, University of Partas; Computer Technology Institute

H. T. Vergos, University of Partas; Computer Technology Institute

C. Efstathiou, TEI of Athens

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/OLT.2003.1214372

In this paper we present a new pseudorandom BIST scheme for high-speed adders. Under this scheme an adder is simultaneously used as a test pattern generator and as a response compactor during its own testing. The main advantages of the proposed scheme, compared to prior methods, are minimal performance penalty, small hardware overhead and the benefits of at-speed testing.

Citation:

D. G. Nikolos, D. Nikolos, H. T. Vergos, C. Efstathiou, "An Efficient BIST scheme for High-Speed Adders," iolts, pp.89, 9th IEEE International On-Line Testing Symposium, 2003

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