Designing FPGA based Self-Testing Checkers for m-out-of-n Codes

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	Similar Articles Articles by A. Matrosova Articles by V. Ostrovsky Articles by I. Levin Articles by K. Nikitin

9th IEEE International On-Line Testing Symposium

Kos Island, Greece

July 07-July 09

ISBN: 0-7695-1968-7

	ASCII Text	x
	A. Matrosova, V. Ostrovsky, I. Levin, K. Nikitin, "Designing FPGA based Self-Testing Checkers for m-out-of-n Codes," IEEE International On-Line Testing Symposium, pp. 49, 9th IEEE International On-Line Testing Symposium, 2003.

	BibTex	x
	@article{ 10.1109/OLT.2003.1214366, author = {A. Matrosova and V. Ostrovsky and I. Levin and K. Nikitin}, title = {Designing FPGA based Self-Testing Checkers for m-out-of-n Codes}, journal ={IEEE International On-Line Testing Symposium}, volume = {0}, year = {2003}, isbn = {0-7695-1968-7}, pages = {49}, doi = {http://doi.ieeecomputersociety.org/10.1109/OLT.2003.1214366}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - IEEE International On-Line Testing Symposium TI - Designing FPGA based Self-Testing Checkers for m-out-of-n Codes SN - 0-7695-1968-7 SP EP A1 - A. Matrosova, A1 - V. Ostrovsky, A1 - I. Levin, A1 - K. Nikitin, PY - 2003 KW - null VL - 0 JA - IEEE International On-Line Testing Symposium ER -

A. Matrosova, Tomsk State University, Russia

V. Ostrovsky, Tel Aviv University, Israel

I. Levin, Tel Aviv University, Israel

K. Nikitin, Tomsk State University, Russia

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/OLT.2003.1214366

The paper describes a specific method for designing self-checking checkers for m-out-of-n codes. The method is oriented to the Field Programmable Gate Arrays technology and is based on decomposing the sum-of-minterms corresponding to an m-out-of-n code. The self-testing property of the proposed checker is proven for a set of multiple stuck-at faults at input and output poles of a Logic Cell. An estimated complexity of obtained m-out-of-n checker demonstrates high efficiency of the proposed method.

Citation:

A. Matrosova, V. Ostrovsky, I. Levin, K. Nikitin, "Designing FPGA based Self-Testing Checkers for m-out-of-n Codes," iolts, pp.49, 9th IEEE International On-Line Testing Symposium, 2003

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