A Sense Amplifier Based Circuit for Concurrent Detection of Soft and Timing Errors in CMOS ICs

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	Similar Articles Articles by Y. Tsiatouhas Articles by S. Matakias Articles by A. Arapoyanni Articles by Th. Haniotakis

9th IEEE International On-Line Testing Symposium

Kos Island, Greece

July 07-July 09

ISBN: 0-7695-1968-7

	ASCII Text	x
	Y. Tsiatouhas, S. Matakias, A. Arapoyanni, Th. Haniotakis, "A Sense Amplifier Based Circuit for Concurrent Detection of Soft and Timing Errors in CMOS ICs," IEEE International On-Line Testing Symposium, pp. 12, 9th IEEE International On-Line Testing Symposium, 2003.

	BibTex	x
	@article{ 10.1109/OLT.2003.1214360, author = {Y. Tsiatouhas and S. Matakias and A. Arapoyanni and Th. Haniotakis}, title = {A Sense Amplifier Based Circuit for Concurrent Detection of Soft and Timing Errors in CMOS ICs}, journal ={IEEE International On-Line Testing Symposium}, volume = {0}, year = {2003}, isbn = {0-7695-1968-7}, pages = {12}, doi = {http://doi.ieeecomputersociety.org/10.1109/OLT.2003.1214360}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - IEEE International On-Line Testing Symposium TI - A Sense Amplifier Based Circuit for Concurrent Detection of Soft and Timing Errors in CMOS ICs SN - 0-7695-1968-7 SP EP A1 - Y. Tsiatouhas, A1 - S. Matakias, A1 - A. Arapoyanni, A1 - Th. Haniotakis, PY - 2003 KW - null VL - 0 JA - IEEE International On-Line Testing Symposium ER -

Y. Tsiatouhas, University of Ioannina

S. Matakias, University of Athens

A. Arapoyanni, University of Athens

Th. Haniotakis, Southern Illinois University

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/OLT.2003.1214360

We propose a new concurrent soft and timing error detection circuit that exploits the time redundancy approach to achieve tolerance with respect to transient and delay faults. The idea is based on current mode sense amplifier topologies to provide fast error detection times.

Citation:

Y. Tsiatouhas, S. Matakias, A. Arapoyanni, Th. Haniotakis, "A Sense Amplifier Based Circuit for Concurrent Detection of Soft and Timing Errors in CMOS ICs," iolts, pp.12, 9th IEEE International On-Line Testing Symposium, 2003

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