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IEEE-INNS-ENNS International Joint Conference on Neural Networks (IJCNN'00)-Volume 6
Non-Destructive Test by the Hopfield Network
Como, Italy
July 24-July 27
ISBN: 0-7695-0619-4
ASCII Text
x 
 
S. Barcherini, L. Cipiccia, M. Maggi, S. Fiori, P. Burrascano, "Non-Destructive Test by the Hopfield Network," Neural Networks, IEEE - INNS - ENNS International Joint Conference on, vol. 6, pp. 6381, IEEE-INNS-ENNS International Joint Conference on Neural Networks (IJCNN'00)-Volume 6, 2000.
 
 
BibTex
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@article{ 10.1109/IJCNN.2000.859425,
author = {S. Barcherini and L. Cipiccia and M. Maggi and S. Fiori and P. Burrascano},
title = {Non-Destructive Test by the Hopfield Network},
journal ={Neural Networks, IEEE - INNS - ENNS International Joint Conference on},
volume = {6},
year = {2000},
issn = {1098-7576},
pages = {6381},
doi = {http://doi.ieeecomputersociety.org/10.1109/IJCNN.2000.859425},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Neural Networks, IEEE - INNS - ENNS International Joint Conference on
TI - Non-Destructive Test by the Hopfield Network
SN - 1098-7576
SP
EP
A1 - S. Barcherini,
A1 - L. Cipiccia,
A1 - M. Maggi,
A1 - S. Fiori,
A1 - P. Burrascano,
PY - 2000
VL - 6
JA - Neural Networks, IEEE - INNS - ENNS International Joint Conference on
ER -
 
S. Barcherini, University of Perugia
L. Cipiccia, University of Perugia
M. Maggi, University of Perugia
S. Fiori, University of Perugia
P. Burrascano, University of Perugia
The aim of this work is to propose and discuss a technique, which allows for classifying the defects found in metallic components based on a non-destructive Remote-Field Eddy-Current Technique experimental test (RFEC). To this aim, we propose to employ a Hopfield associative memory as a neural classifier. The performances of the proposed approach are evaluated on real-world data.
Citation:
S. Barcherini, L. Cipiccia, M. Maggi, S. Fiori, P. Burrascano, "Non-Destructive Test by the Hopfield Network," ijcnn, vol. 6, pp.6381, IEEE-INNS-ENNS International Joint Conference on Neural Networks (IJCNN'00)-Volume 6, 2000
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