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15th IEEE International Conference on Tools with Artificial Intelligence (ICTAI'03)
Detecting Spatial Outliers with Multiple Attributes
Sacramento, California, USA
November 03-November 05
ISBN: 0-7695-2038-3
Chang-Tien Lu, Virginia Polytechnic Institute and State University
Dechang Chen, Uniformed Services University of the Health Sciences
Yufeng Kou, Virginia Polytechnic Institute and State University
A spatial outlier is a spatially referenced object whose non-spatial attribute values are significantly different from the values of its neighborhood. Identification of spatial outliers can lead to the discovery of unexpected, interesting, and useful spatial patterns for further analysis. Previous work in spatial outlier detection focuses on detecting spatial outliers with a single attribute. In the paper, we propose two approaches to discover spatial outliers with multiple attributes. We formulate the multi-attribute spatial outlier detection problem in a general way, provide two effective detection algorithms, and analyze their computation complexity. In addition, using a real-world census data, we demonstrate that our approaches can effectively identify local abnormality in large spatial data sets.
Citation:
Chang-Tien Lu, Dechang Chen, Yufeng Kou, "Detecting Spatial Outliers with Multiple Attributes," ictai, pp.122, 15th IEEE International Conference on Tools with Artificial Intelligence (ICTAI'03), 2003
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