loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
26th International Conference on Software Engineering (ICSE'04)
Bi-Criteria Models for All-Uses Test Suite Reduction
Edinburgh, Scotland, United Kingdom
May 23-May 28
ISBN: 0-7695-2163-0
Jennifer Black, Northeastern University
Emanuel Melachrinoudis, Northeastern University
David Kaeli, Northeastern University
Using bi-criteria decision making analysis, a new model for test suite minimization has been developed that pursues two objectives: minimizing a test suite with regard to a particular level of coverage while simultaneously maximizing error detection rates. This new representation makes it possible to achieve significant reductions in test suite size without experiencing a decrease in error detection rates. Using the all-uses interprocedural data flow testing criterion, two binary integer linear programming models were evaluated, one a single-objective model, the other a weighted-sums bicriteria model. The applicability of the bi-criteria model to regression test suite maintenance was also evaluated. The data show that minimization based solely on definition-use association coverage may have a negative impact on the error detection rate as compared to minimization performed with a bi-criteria model that also takes into account the ability of test cases to reveal error. Results obtained with the bi-criteria model also indicate that test suites minimized with respect to a collection of program faults are effective at revealing subsequent program faults.
Citation:
Jennifer Black, Emanuel Melachrinoudis, David Kaeli, "Bi-Criteria Models for All-Uses Test Suite Reduction," icse, pp.106-115, 26th International Conference on Software Engineering (ICSE'04), 2004
Usage of this product signifies your acceptance of the Terms of Use.