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17th International Conference on Pattern Recognition (ICPR'04) - Volume 4
Optimum Block Size Detection for Image Quality Measure
Cambridge UK
August 23-August 26
ISBN: 0-7695-2128-2
ASCII Text
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Young-Bin Kwon, Jaehwa Park, "Optimum Block Size Detection for Image Quality Measure," Pattern Recognition, International Conference on, vol. 4, pp. 491-494, 17th International Conference on Pattern Recognition (ICPR'04) - Volume 4, 2004.
 
 
BibTex
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@article{ 10.1109/ICPR.2004.1333818,
author = {Young-Bin Kwon and Jaehwa Park},
title = {Optimum Block Size Detection for Image Quality Measure},
journal ={Pattern Recognition, International Conference on},
volume = {4},
year = {2004},
issn = {1051-4651},
pages = {491-494},
doi = {http://doi.ieeecomputersociety.org/10.1109/ICPR.2004.1333818},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Pattern Recognition, International Conference on
TI - Optimum Block Size Detection for Image Quality Measure
SN - 1051-4651
SP491
EP494
A1 - Young-Bin Kwon,
A1 - Jaehwa Park,
PY - 2004
KW - null
VL - 4
JA - Pattern Recognition, International Conference on
ER -
 
Young-Bin Kwon, Chung-Ang University
Jaehwa Park, Chung-Ang University
This paper deals with the quality of the image itself as well as the algorithm used for evaluating the quality of the fingerprints to construct an effective algorithm for evaluating the quality of the fingerprints. The quality of the fingerprint is acquired by taking the regional quality of each fingerprint image. The amount of fingerprint varies according to the size of each block which makes the result unsteady. We concentrated on finding the right size for the block used to acquire the fingerprint image. Also, the quality distribution included in the fingerprint image was acquired when the optimal block size was adopted.
Citation:
Young-Bin Kwon, Jaehwa Park, "Optimum Block Size Detection for Image Quality Measure," icpr, vol. 4, pp.491-494, 17th International Conference on Pattern Recognition (ICPR'04) - Volume 4, 2004
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