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17th International Conference on Pattern Recognition (ICPR'04) - Volume 2
An Efficient Automatic Redeye Detection and Correction Algorithm
Cambridge UK
August 23-August 26
ISBN: 0-7695-2128-2
Huitao Luo, Hewlett-Packard Labs, Palo Alto, CA
Jonathan Yen, Hewlett-Packard Labs, Palo Alto, CA
Dan Tretter, Hewlett-Packard Labs, Palo Alto, CA
A fully automatic redeye detection and correction algorithm is presented to address the redeye artifacts in digital photos. The algorithm contains a redeye detection part and a correction part. The detection part is modeled as a feature based object detection problem. Adaboost is used to simultaneously select features and train the classifier. A new feature set is designed to address the orientation-dependency problem associated with the Haar-like features commonly used for object detection design. For each detected redeye, a correction algorithm is applied to do adaptive desaturation and darkening over the redeye region.
Citation:
Huitao Luo, Jonathan Yen, Dan Tretter, "An Efficient Automatic Redeye Detection and Correction Algorithm," icpr, vol. 2, pp.883-886, 17th International Conference on Pattern Recognition (ICPR'04) - Volume 2, 2004
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