loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
17th International Conference on Pattern Recognition (ICPR'04) - Volume 2
Spectral Characterization of Orientation Data along Curvilinear Structures
Cambridge UK
August 23-August 26
ISBN: 0-7695-2128-2
J. P. Da Costa, Equipe Signal et Image; ENITA de Bordeaux
C. Germain, Equipe Signal et Image; ENITA de Bordeaux
P. Baylou, Equipe Signal et Image
This paper lies within the scope of texture analysis. We focus on anisotropic textures and propose an approach to measure the ripple of texture patterns. It assumes that the patterns are represented by some characteristic curves called generatrices (i.e. edges, level curves). Two steps are involved. The first one deals with the estimation of the orientation along the generatrices. The second step consists in computing the power spectrum of the generatrix orientation. The global texture ripple is captured by the ripple spectrum which is computed by cumulating the orientation spectra of all individual generatrix. The approach is exercised on synthetic textures and on composite material images.
Citation:
J. P. Da Costa, C. Germain, P. Baylou, "Spectral Characterization of Orientation Data along Curvilinear Structures," icpr, vol. 2, pp.517-520, 17th International Conference on Pattern Recognition (ICPR'04) - Volume 2, 2004
Usage of this product signifies your acceptance of the Terms of Use.