17th International Conference on Pattern Recognition (ICPR'04) - Volume 2
Four Metrics for Efficiently Comparing Attributed Trees
Cambridge UK
August 23-August 26
ISBN: 0-7695-2128-2
We address the problem of comparing attributed trees and propose four novel distance metrics centered around the notion of a maximal similarity common subtree, and hence can be computed in polynomial time. We experimentally validate the usefulness of our metrics on shape matching tasks, and compare them with edit-distance.
Citation:
Andrea Torsello, Dzena Hidovic, Marcello Pelillo, "Four Metrics for Efficiently Comparing Attributed Trees," icpr, vol. 2, pp.467-470, 17th International Conference on Pattern Recognition (ICPR'04) - Volume 2, 2004