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17th International Conference on Pattern Recognition (ICPR'04) - Volume 2
Hough Transform in Log-Polar Image Including Foveal and Peripheral Information
Cambridge UK
August 23-August 26
ISBN: 0-7695-2128-2
ASCII Text
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Jang-Sik Kim, You-Suk Bae, Sung-Il Chien, "Hough Transform in Log-Polar Image Including Foveal and Peripheral Information," Pattern Recognition, International Conference on, vol. 2, pp. 60-63, 17th International Conference on Pattern Recognition (ICPR'04) - Volume 2, 2004.
 
 
BibTex
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@article{ 10.1109/ICPR.2004.1334038,
author = {Jang-Sik Kim and You-Suk Bae and Sung-Il Chien},
title = {Hough Transform in Log-Polar Image Including Foveal and Peripheral Information},
journal ={Pattern Recognition, International Conference on},
volume = {2},
year = {2004},
issn = {1051-4651},
pages = {60-63},
doi = {http://doi.ieeecomputersociety.org/10.1109/ICPR.2004.1334038},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Pattern Recognition, International Conference on
TI - Hough Transform in Log-Polar Image Including Foveal and Peripheral Information
SN - 1051-4651
SP60
EP63
A1 - Jang-Sik Kim,
A1 - You-Suk Bae,
A1 - Sung-Il Chien,
PY - 2004
KW - null
VL - 2
JA - Pattern Recognition, International Conference on
ER -
 
Jang-Sik Kim, Union Community Co., Ltd, Korea
You-Suk Bae, Korea Polytechnic University, Korea
Sung-Il Chien, Kyungpook National University, Korea
Line equation in Cartesian space can be mapped conformally to log-polar. But many the applications of log-polar mapping are using only the peripheral region. This paper presents a method of a Hough transform for a log-polar mapped edge image that includes both foveal and peripheral visual information. It is shown that this method achieves a good performance for line detection on the log-polar space.
Citation:
Jang-Sik Kim, You-Suk Bae, Sung-Il Chien, "Hough Transform in Log-Polar Image Including Foveal and Peripheral Information," icpr, vol. 2, pp.60-63, 17th International Conference on Pattern Recognition (ICPR'04) - Volume 2, 2004
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