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17th International Conference on Pattern Recognition (ICPR'04) - Volume 2
Lie Algebra Template Tracking
Cambridge UK
August 23-August 26
ISBN: 0-7695-2128-2
ASCII Text
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Eduardo Bayro-Corrochano, Jaime Ortegon-Aguilar, "Lie Algebra Template Tracking," Pattern Recognition, International Conference on, vol. 2, pp. 56-59, 17th International Conference on Pattern Recognition (ICPR'04) - Volume 2, 2004.
 
 
BibTex
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@article{ 10.1109/ICPR.2004.1334036,
author = {Eduardo Bayro-Corrochano and Jaime Ortegon-Aguilar},
title = {Lie Algebra Template Tracking},
journal ={Pattern Recognition, International Conference on},
volume = {2},
year = {2004},
issn = {1051-4651},
pages = {56-59},
doi = {http://doi.ieeecomputersociety.org/10.1109/ICPR.2004.1334036},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - Pattern Recognition, International Conference on
TI - Lie Algebra Template Tracking
SN - 1051-4651
SP56
EP59
A1 - Eduardo Bayro-Corrochano,
A1 - Jaime Ortegon-Aguilar,
PY - 2004
KW - null
VL - 2
JA - Pattern Recognition, International Conference on
ER -
 
Eduardo Bayro-Corrochano, CINVESTAV Unidad Guadalajara, M?xico
Jaime Ortegon-Aguilar, CINVESTAV Unidad Guadalajara, M?xico
Visual cues are often very difficult to track. We use an effective least squares estimation of the Lie algebra parameters to find the affine transformation involved in a visual region tracking. These parameters represent the geodesics of the optimal transformation orbit. Our experiments validate the effectiveness of the method.
Citation:
Eduardo Bayro-Corrochano, Jaime Ortegon-Aguilar, "Lie Algebra Template Tracking," icpr, vol. 2, pp.56-59, 17th International Conference on Pattern Recognition (ICPR'04) - Volume 2, 2004
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