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17th International Conference on Pattern Recognition (ICPR'04) - Volume 1
Linear Discriminant Analysis and Discriminative Log-linear Modeling
Cambridge UK
August 23-August 26
ISBN: 0-7695-2128-2
Daniel Keysers, RWTH Aachen University, Germany
Hermann Ney, RWTH Aachen University, Germany
We discuss the relationship between the discriminative training of Gaussian models and the maximum entropy framework for log-linear models. Observing that linear transforms leave the distributions resulting from the log-linear model unchanged, we derive a discriminative linear feature reduction technique from the maximum entropy approach and compare it to the well-known linear discriminant analysis. From experiments on different corpora we observe that the new technique performs better than linear discriminant analysis if the dimensionality of the feature space is large with respect to the number of classes.
Citation:
Daniel Keysers, Hermann Ney, "Linear Discriminant Analysis and Discriminative Log-linear Modeling," icpr, vol. 1, pp.156-159, 17th International Conference on Pattern Recognition (ICPR'04) - Volume 1, 2004
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