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16th International Conference on Pattern Recognition (ICPR'02) - Volume 2
Unified Approach to Image Distortion
Quebec City, QC, Canada
August 11-August 15
ISBN: 0-7695-1695-X
ASCII Text
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Toru Tamaki, Tsuyoshi Yamamura, Noboru Ohnishi, "Unified Approach to Image Distortion," Pattern Recognition, International Conference on, vol. 2, pp. 20584, 16th International Conference on Pattern Recognition (ICPR'02) - Volume 2, 2002.
 
 
BibTex
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@article{ 10.1109/ICPR.2002.1048370,
author = {Toru Tamaki and Tsuyoshi Yamamura and Noboru Ohnishi},
title = {Unified Approach to Image Distortion},
journal ={Pattern Recognition, International Conference on},
volume = {2},
year = {2002},
issn = {1051-4651},
pages = {20584},
doi = {http://doi.ieeecomputersociety.org/10.1109/ICPR.2002.1048370},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - Pattern Recognition, International Conference on
TI - Unified Approach to Image Distortion
SN - 1051-4651
SP
EP
A1 - Toru Tamaki,
A1 - Tsuyoshi Yamamura,
A1 - Noboru Ohnishi,
PY - 2002
KW - null
VL - 2
JA - Pattern Recognition, International Conference on
ER -
 
Toru Tamaki, Niigata University
Tsuyoshi Yamamura, Aichi Prefectural University
Noboru Ohnishi, Nagoya University and RIKEN
We propose a new unified approach to deal with two formulations of image distortion and a method for estimating the distortion parameters by using the both formulation; So far either of the two formulations has been developed separately. The proposed method is based on image registration and consists of nonlinear optimization to estimate parameters including view change and radial distortion. Experimental results demonstrat that our approach works well for both formulations.
Citation:
Toru Tamaki, Tsuyoshi Yamamura, Noboru Ohnishi, "Unified Approach to Image Distortion," icpr, vol. 2, pp.20584, 16th International Conference on Pattern Recognition (ICPR'02) - Volume 2, 2002
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