15th International Conference on Pattern Recognition (ICPR'00) - Volume 4
Shape Measurement and Sketching Systems for Porcelain Using Image Technology
Barcelona, Spain
September 03-September 08
ISBN: 0-7695-0750-6
CAD effectively generates NC data used to sketch patterns. Section 3 describes generating NC data using measurement results using the method in Section 2 and CAD and sketching driven by NC data. Section 4 generates NC data for sketching actual patterns and describes an experiment sketching on porcelain using NC data. Experimental results verify the system's effectiveness.
Citation:
Kazuhiko Shiranita, Kenichiro Hayashi, Akifumi Otsubo, Ryuzo Takiyama, "Shape Measurement and Sketching Systems for Porcelain Using Image Technology," icpr, vol. 4, pp.4795, 15th International Conference on Pattern Recognition (ICPR'00) - Volume 4, 2000