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15th International Conference on Pattern Recognition (ICPR'00) - Volume 4
Shape Measurement and Sketching Systems for Porcelain Using Image Technology
Barcelona, Spain
September 03-September 08
ISBN: 0-7695-0750-6
Kazuhiko Shiranita, Industrial Technology Center of Saga Prefecture
Kenichiro Hayashi, Industrial Technology Center of Saga Prefecture
Akifumi Otsubo, Industrial Technology Center of Saga Prefecture
Ryuzo Takiyama, Kyushu Institute of Design
CAD effectively generates NC data used to sketch patterns. Section 3 describes generating NC data using measurement results using the method in Section 2 and CAD and sketching driven by NC data. Section 4 generates NC data for sketching actual patterns and describes an experiment sketching on porcelain using NC data. Experimental results verify the system's effectiveness.
Citation:
Kazuhiko Shiranita, Kenichiro Hayashi, Akifumi Otsubo, Ryuzo Takiyama, "Shape Measurement and Sketching Systems for Porcelain Using Image Technology," icpr, vol. 4, pp.4795, 15th International Conference on Pattern Recognition (ICPR'00) - Volume 4, 2000
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