On-Line Signature Verification Using Pen-Position, Pen-Pressure and Pen-Inclination Trajectories

I
ICPR
2000
15th International Conference on Pattern Recognition (ICPR'00) - Volume 4
Abstract - On-Line Signature Verification Using Pen-Position, Pen-Pressure and Pen-Inclination Trajectories

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15th International Conference on Pattern Recognition (ICPR'00) - Volume 4

Barcelona, Spain

September 03-September 08

ISBN: 0-7695-0750-6

	ASCII Text	x
	T. Ohishi, Y. Komiya, T. Matsumoto, "On-Line Signature Verification Using Pen-Position, Pen-Pressure and Pen-Inclination Trajectories," Pattern Recognition, International Conference on, vol. 4, pp. 4547, 15th International Conference on Pattern Recognition (ICPR'00) - Volume 4, 2000.

	BibTex	x
	@article{ 10.1109/ICPR.2000.902978, author = {T. Ohishi and Y. Komiya and T. Matsumoto}, title = {On-Line Signature Verification Using Pen-Position, Pen-Pressure and Pen-Inclination Trajectories}, journal ={Pattern Recognition, International Conference on}, volume = {4}, year = {2000}, isbn = {0-7695-0750-6}, pages = {4547}, doi = {http://doi.ieeecomputersociety.org/10.1109/ICPR.2000.902978}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Pattern Recognition, International Conference on TI - On-Line Signature Verification Using Pen-Position, Pen-Pressure and Pen-Inclination Trajectories SN - 0-7695-0750-6 SP EP A1 - T. Ohishi, A1 - Y. Komiya, A1 - T. Matsumoto, PY - 2000 VL - 4 JA - Pattern Recognition, International Conference on ER -

T. Ohishi, Waseda University

Y. Komiya, Waseda University

T. Matsumoto, Waseda University

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICPR.2000.902978

A new algorithm is proposed for pen-input on-line signature verification incorporating pen-position, pen-pressure and pen-inclinations trajectories. Preliminary experimental result looks encouraging.

Citation:

T. Ohishi, Y. Komiya, T. Matsumoto, "On-Line Signature Verification Using Pen-Position, Pen-Pressure and Pen-Inclination Trajectories," icpr, vol. 4, pp.4547, 15th International Conference on Pattern Recognition (ICPR'00) - Volume 4, 2000

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