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15th International Conference on Pattern Recognition (ICPR'00) - Volume 3
A Color Contour Detector Based on Dempster-Shafer Theory
Barcelona, Spain
September 03-September 08
ISBN: 0-7695-0750-6
ASCII Text
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Michel Chapron, "A Color Contour Detector Based on Dempster-Shafer Theory," Pattern Recognition, International Conference on, vol. 3, pp. 7150, 15th International Conference on Pattern Recognition (ICPR'00) - Volume 3, 2000.
 
 
BibTex
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@article{ 10.1109/ICIP.2000.899833,
author = {Michel Chapron},
title = {A Color Contour Detector Based on Dempster-Shafer Theory},
journal ={Pattern Recognition, International Conference on},
volume = {3},
year = {2000},
isbn = {0-7695-0750-6},
pages = {7150},
doi = {http://doi.ieeecomputersociety.org/10.1109/ICIP.2000.899833},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Pattern Recognition, International Conference on
TI - A Color Contour Detector Based on Dempster-Shafer Theory
SN - 0-7695-0750-6
SP
EP
A1 - Michel Chapron,
PY - 2000
VL - 3
JA - Pattern Recognition, International Conference on
ER -
 
Michel Chapron, ENSEA-ETIS
Segmentation based on contour detection is a relevant stage before image interpretation or pattern recognition. This paper is concerned with a new color contour detector founded on Dempster-Shafer theory. It proposes a method for computing the orientation and magnitude of a gradient defined on color images.
Citation:
Michel Chapron, "A Color Contour Detector Based on Dempster-Shafer Theory," icpr, vol. 3, pp.7150, 15th International Conference on Pattern Recognition (ICPR'00) - Volume 3, 2000
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