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15th International Conference on Pattern Recognition (ICPR'00) - Volume 3
Segmentation of Color Image Using Deterministic Annealing EM
Barcelona, Spain
September 03-September 08
ISBN: 0-7695-0750-6
ASCII Text
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Wan Hyun Cho, Soon Young Park, Jong Hyun Park, "Segmentation of Color Image Using Deterministic Annealing EM," Pattern Recognition, International Conference on, vol. 3, pp. 3646, 15th International Conference on Pattern Recognition (ICPR'00) - Volume 3, 2000.
 
 
BibTex
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@article{ 10.1109/ICPR.2000.903627,
author = {Wan Hyun Cho and Soon Young Park and Jong Hyun Park},
title = {Segmentation of Color Image Using Deterministic Annealing EM},
journal ={Pattern Recognition, International Conference on},
volume = {3},
year = {2000},
isbn = {0-7695-0750-6},
pages = {3646},
doi = {http://doi.ieeecomputersociety.org/10.1109/ICPR.2000.903627},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Pattern Recognition, International Conference on
TI - Segmentation of Color Image Using Deterministic Annealing EM
SN - 0-7695-0750-6
SP
EP
A1 - Wan Hyun Cho,
A1 - Soon Young Park,
A1 - Jong Hyun Park,
PY - 2000
VL - 3
JA - Pattern Recognition, International Conference on
ER -
 
Wan Hyun Cho, Chonnam National University
Soon Young Park, Mokpo National University
Jong Hyun Park, Mokpo National University
In this paper, we present a color image segmentation algorithm based on statistical models. A novel deterministic annealing Expectation Maximization (EM) formula is used to estimate the parameters of the Gaussian Mixture Model (GMM), which represents the multi-colored objects statistically. The experimental results show that the proposed deterministic annealing EM provides a global optimal solution for the ML parameter estimation and the image field is segmented efficiently by using the estimates.
Citation:
Wan Hyun Cho, Soon Young Park, Jong Hyun Park, "Segmentation of Color Image Using Deterministic Annealing EM," icpr, vol. 3, pp.3646, 15th International Conference on Pattern Recognition (ICPR'00) - Volume 3, 2000
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