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15th International Conference on Pattern Recognition (ICPR'00) - Volume 3
Texel Extraction on Inclined Textures by Adaptive Thresholding of Local Scales
Barcelona, Spain
September 03-September 08
ISBN: 0-7695-0750-6
Sylvie Lelandais, University of Evry
Paul Checchin, University of Evry
In this article, we introduce a new method for texel extraction on inclined textured planes. This method relies on a technique for determination of local frequencies and the use of a “Shape from Texture” method derived from the work of Lu et al. [6]. This method allows making an adapted extraction to the texture size and the deformations introduced by the perspective projection. The texels extracted in that way can be used for texture characterization and the detections of flaws.This article describes, in a general way, the determination of the local frequencies, as well as the orientation. It explains in detail the extraction of texels and gives results obtained with natural textures.
Citation:
Laurent Boutté, Justin Plantier, Sylvie Lelandais, Paul Checchin, "Texel Extraction on Inclined Textures by Adaptive Thresholding of Local Scales," icpr, vol. 3, pp.3560, 15th International Conference on Pattern Recognition (ICPR'00) - Volume 3, 2000
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