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15th International Conference on Pattern Recognition (ICPR'00) - Volume 3
Acceleration of Thresholding and Labeling Operations through Geometric Processing of Gray-Level Images
Barcelona, Spain
September 03-September 08
ISBN: 0-7695-0750-6
ASCII Text
x 
 
M. García, B. Vintimilla, "Acceleration of Thresholding and Labeling Operations through Geometric Processing of Gray-Level Images," Pattern Recognition, International Conference on, vol. 3, pp. 3429, 15th International Conference on Pattern Recognition (ICPR'00) - Volume 3, 2000.
 
 
BibTex
x
 
@article{ 10.1109/ICPR.2000.903575,
author = {M. García and B. Vintimilla},
title = {Acceleration of Thresholding and Labeling Operations through Geometric Processing of Gray-Level Images},
journal ={Pattern Recognition, International Conference on},
volume = {3},
year = {2000},
isbn = {0-7695-0750-6},
pages = {3429},
doi = {http://doi.ieeecomputersociety.org/10.1109/ICPR.2000.903575},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Pattern Recognition, International Conference on
TI - Acceleration of Thresholding and Labeling Operations through Geometric Processing of Gray-Level Images
SN - 0-7695-0750-6
SP
EP
A1 - M. García,
A1 - B. Vintimilla,
PY - 2000
VL - 3
JA - Pattern Recognition, International Conference on
ER -
 
This paper explores the utilization of adaptive triangular meshes representing gray-level images to accelerate basic image processing operations. In particular, two algorithms for thresholding and labeling gray-level images represented with adaptive triangular meshes are described and evaluated. Experimental results with real gray-level images show that it is possible to perform faster by working in the 3D geometric domain than by sequentially processing all the pixels contained in the original images.
Citation:
M. García, B. Vintimilla, "Acceleration of Thresholding and Labeling Operations through Geometric Processing of Gray-Level Images," icpr, vol. 3, pp.3429, 15th International Conference on Pattern Recognition (ICPR'00) - Volume 3, 2000
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