15th International Conference on Pattern Recognition (ICPR'00) - Volume 2 Rough Histograms for Robust Statistics Barcelona, Spain September 03-September 08 ISBN: 0-7695-0750-6
Applied statistics are widely used in pattern recognition and other computing applications to find the most likely value of a parameter. The use of classical empirical statistics is based upon assumption about normality of underlying density distribution of data. When the data is corrupted by contaminated noise, then classical tools are usually not robust enough and the estimation of the mode is biased. In this article, we propose to estimate the main mode of a distribution by means of a rough histogram and we show that this estimation is robust to contamination.
Citation:
Olivier Strauss, Frédéric Comby, Marie-José Aldon, "Rough Histograms for Robust Statistics," icpr, vol. 2, pp.2684, 15th International Conference on Pattern Recognition (ICPR'00) - Volume 2, 2000 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||