Validation of Relative Feature Importance Using a Natural Data Set

I
ICPR
2000
15th International Conference on Pattern Recognition (ICPR'00) - Volume 2
Abstract - Validation of Relative Feature Importance Using a Natural Data Set

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15th International Conference on Pattern Recognition (ICPR'00) - Volume 2

Barcelona, Spain

September 03-September 08

ISBN: 0-7695-0750-6

	ASCII Text	x
	H.J. Holz, M.H. Loew, "Validation of Relative Feature Importance Using a Natural Data Set," Pattern Recognition, International Conference on, vol. 2, pp. 2414, 15th International Conference on Pattern Recognition (ICPR'00) - Volume 2, 2000.

	BibTex	x
	@article{ 10.1109/ICPR.2000.906100, author = {H.J. Holz and M.H. Loew}, title = {Validation of Relative Feature Importance Using a Natural Data Set}, journal ={Pattern Recognition, International Conference on}, volume = {2}, year = {2000}, isbn = {0-7695-0750-6}, pages = {2414}, doi = {http://doi.ieeecomputersociety.org/10.1109/ICPR.2000.906100}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Pattern Recognition, International Conference on TI - Validation of Relative Feature Importance Using a Natural Data Set SN - 0-7695-0750-6 SP EP A1 - H.J. Holz, A1 - M.H. Loew, PY - 2000 VL - 2 JA - Pattern Recognition, International Conference on ER -

H.J. Holz, George Washington University

M.H. Loew, George Washington University

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICPR.2000.906100

Feature analysis for classification is based on the discriminatory power of features. In previous research, we have presented a metric for measuring the non-parametric discriminatory power of features called Relative Feature Importance (RFI). RFI has been shown to correctly rank features for a variety of artificial data sets. In this re-search, we validate RFI on natural data, using a multi-class natural data set.

Citation:

H.J. Holz, M.H. Loew, "Validation of Relative Feature Importance Using a Natural Data Set," icpr, vol. 2, pp.2414, 15th International Conference on Pattern Recognition (ICPR'00) - Volume 2, 2000

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