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15th International Conference on Pattern Recognition (ICPR'00) - Volume 2
Measuring the Complexity of Classification Problems
Barcelona, Spain
September 03-September 08
ISBN: 0-7695-0750-6
Tin Kam Ho, Bell Labs, Lucent Technologies
Mitra Basu, City University of New York
We studied a number of measures that characterize the difficulty of a classification problem. We compared a set of real world problems to random combinations of points in this measurement space and found that real problems contain structures that are significantly different from the random sets. Distribution of problems in this space reveals that there exist at least two independent factors affecting a problem's difficulty, and that they have notable joint effects. We suggest using this space to describe a classifier's domain of competence. This can guide static and dynamic selection of classifiers for specific problems as well as subproblems formed by confinement, projections, and transformations of the feature vectors.
Citation:
Tin Kam Ho, Mitra Basu, "Measuring the Complexity of Classification Problems," icpr, vol. 2, pp.2043, 15th International Conference on Pattern Recognition (ICPR'00) - Volume 2, 2000
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