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15th International Conference on Pattern Recognition (ICPR'00) - Volume 1
Evaluation of Curve Length Measurements
Barcelona, Spain
September 03-September 08
ISBN: 0-7695-0750-6
ASCII Text
x 
 
Reinhard Klette, Ben Yip, "Evaluation of Curve Length Measurements," Pattern Recognition, International Conference on, vol. 1, pp. 1610, 15th International Conference on Pattern Recognition (ICPR'00) - Volume 1, 2000.
 
 
BibTex
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@article{ 10.1109/ICPR.2000.905411,
author = {Reinhard Klette and Ben Yip},
title = {Evaluation of Curve Length Measurements},
journal ={Pattern Recognition, International Conference on},
volume = {1},
year = {2000},
isbn = {0-7695-0750-6},
pages = {1610},
doi = {http://doi.ieeecomputersociety.org/10.1109/ICPR.2000.905411},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Pattern Recognition, International Conference on
TI - Evaluation of Curve Length Measurements
SN - 0-7695-0750-6
SP
EP
A1 - Reinhard Klette,
A1 - Ben Yip,
PY - 2000
VL - 1
JA - Pattern Recognition, International Conference on
ER -
 
Reinhard Klette, Auckland University
Ben Yip, Auckland University
This paper compares two techniques for measuring the length of a digital curve. Both techniques (digital straight segment approximation, minimum length polygon) are known to be convergent estimators. Theoretical convergence results are cited. The focus is on experimental evaluation: several measures are defined, applied and discussed. Test sets are digitized for consecutive resolutions.
Citation:
Reinhard Klette, Ben Yip, "Evaluation of Curve Length Measurements," icpr, vol. 1, pp.1610, 15th International Conference on Pattern Recognition (ICPR'00) - Volume 1, 2000
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