Parametric Identification of Contact Forces Using AFM

I
ICMENS
2004
2004 International Conference on MEMS, NANO and Smart Systems (ICMENS'04)
Abstract - Parametric Identification of Contact Forces Using AFM

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	Similar Articles Articles by EihabM. Abdel-Rahman Articles by Ali H. Nayfeh

2004 International Conference on MEMS, NANO and Smart Systems (ICMENS'04)

Banff, Alberta, Canada

August 25-August 27

ISBN: 0-7695-2189-4

	ASCII Text	x
	EihabM. Abdel-Rahman, Ali H. Nayfeh, "Parametric Identification of Contact Forces Using AFM," MEMS, NANO, and Smart Systems, International Conference on, pp. 541-547, 2004 International Conference on MEMS, NANO and Smart Systems (ICMENS'04), 2004.

	BibTex	x
	@article{ 10.1109/ICMENS.2004.122, author = {EihabM. Abdel-Rahman and Ali H. Nayfeh}, title = {Parametric Identification of Contact Forces Using AFM}, journal ={MEMS, NANO, and Smart Systems, International Conference on}, volume = {0}, year = {2004}, isbn = {0-7695-2189-4}, pages = {541-547}, doi = {http://doi.ieeecomputersociety.org/10.1109/ICMENS.2004.122}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - MEMS, NANO, and Smart Systems, International Conference on TI - Parametric Identification of Contact Forces Using AFM SN - 0-7695-2189-4 SP541 EP547 A1 - EihabM. Abdel-Rahman, A1 - Ali H. Nayfeh, PY - 2004 KW - null VL - 0 JA - MEMS, NANO, and Smart Systems, International Conference on ER -

EihabM. Abdel-Rahman, Virginia Polytechnic Institute and State University

Ali H. Nayfeh, Virginia Polytechnic Institute and State University

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICMENS.2004.122

We propose a comprehensive approach to characterize the contact stiffness of surfaces using the contact-mode of the Atomic Force Microscope (AFM). Our procedure utilizes the subharmonic resonance of order one-half of the probe-tip-sample system in conjunction with higher-order spectralmeasurements to determine independently the quadratic and cubic contact stiffness coefficients.

Citation:

EihabM. Abdel-Rahman, Ali H. Nayfeh, "Parametric Identification of Contact Forces Using AFM," icmens, pp.541-547, 2004 International Conference on MEMS, NANO and Smart Systems (ICMENS'04), 2004

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