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2003 International Conference on MEMS, NANO and Smart Systems (ICMENS'03)
Measurement of the Conductivity Exponent in Random Percolating Networks of Nanoscale Bismuth Clusters
Banff, Alberta, Canada
July 20-July 23
ISBN: 0-7695-1947-4
A. D. F. Dunbar, University of Canterbury
J. G. Partridge, University of Canterbury
M. Schulze, University of Canterbury
S. Scott, University of Canterbury
S. A. Brown, University of Canterbury
Nanoscale bismuth clusters, produced in an inert gas aggregation source, have been deposited between lithographically defined electrical contacts. The conductivity exponent, t, of the 2D percolating network of bismuth clusters has been derived from in-situ electrical measurements. It was found to be 1.32 ± 0.25. This value is comparable with theoretical predictions of t \approx 1.3 for 2D random continuum percolation networks [1].
Citation:
A. D. F. Dunbar, J. G. Partridge, M. Schulze, S. Scott, S. A. Brown, "Measurement of the Conductivity Exponent in Random Percolating Networks of Nanoscale Bismuth Clusters," icmens, pp.350, 2003 International Conference on MEMS, NANO and Smart Systems (ICMENS'03), 2003
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