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Fourth IEEE International Conference on Data Mining (ICDM'04)
Probabilistic Principal Surfaces for Yeast Gene Microarray Data Mining
Brighton, United Kingdom
November 01-November 04
ISBN: 0-7695-2142-8
Antonino Staiano, Universit? di Salerno, Italy
Lara De Vinco, Universit? di Salerno, Italy
Angelo Ciaramella, Universit? di Salerno, Italy
Giancarlo Raiconi, Universit? di Salerno, Italy
Roberto Tagliaferri, Universit? di Salerno, Italy
Roberto Amato, Universit? Federico II di Napoli and INFN Napoli Unit, Italy
Giuseppe Longo, Universit? Federico II di Napoli and INFN Napoli Unit, Italy
Ciro Donalek, Universit? Federico II di Napoli and INFN Napoli Unit, Italy
Gennaro Miele, Universit? Federico II di Napoli and INFN Napoli Unit, Italy
Diego Di Bernardo, Telethon Institute for Genetics and Medicine, Italy
The recent technological advances are producing huge data sets in almost all fields of scientific research, from astronomy to genetics. Although each research field often requires ad-hoc, fine tuned, procedures to properly exploit all the available information inherently present in the data, there is an urgent need for a new generation of general computational theories and tools capable to boost most human activities of data analysis. Here we propose Probabilistic Principal Surfaces (PPS) as an effective high-D data visualization and clustering tool for data mining applications, emphasizing its flexibility and generality of use in data-rich field. In order to better illustrate the potentialities of the method, we also provide a real world case-study by discussing the use of PPS for the analysis of yeast gene expression levels from microarray chips.
Citation:
Antonino Staiano, Lara De Vinco, Angelo Ciaramella, Giancarlo Raiconi, Roberto Tagliaferri, Roberto Amato, Giuseppe Longo, Ciro Donalek, Gennaro Miele, Diego Di Bernardo, "Probabilistic Principal Surfaces for Yeast Gene Microarray Data Mining," icdm, pp.202-208, Fourth IEEE International Conference on Data Mining (ICDM'04), 2004
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