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Seventh International Conference on Document Analysis and Recognition (ICDAR'03) - Volume 2
Investigation of Off-Line Japanese Signature Verification Using a Pattern Matching
Edinburgh, Scotland
August 03-August 06
ISBN: 0-7695-1960-1
Katsuhiko Ueda, Nara National College of Technology
This paper deals with an off-line Japanese signature verification using a pattern matching method. An annoying problem encountered in off-line signature verification using a pattern matching is that variation of signature stroke widths and a registered signature selected from a set of reference samples affect the verification performance. In this paper, we propose a modified pattern matching method, which is independent of stroke widths, and an appropriate selection method of a registered signature to solve this problem. These methods were experimentally compared with a conventional pattern matching method and a random selection method of a registered signature. Experimental results showed that the proposed methods improve the verification performance.
Citation:
Katsuhiko Ueda, "Investigation of Off-Line Japanese Signature Verification Using a Pattern Matching," icdar, vol. 2, pp.951, Seventh International Conference on Document Analysis and Recognition (ICDAR'03) - Volume 2, 2003
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