Compressed Embedded Diagnosis of Logic Cores

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2004 IEEE International Conference on Computer Design (ICCD'04)

San Jose, CA

October 11-October 13

ISBN: 0-7695-2231-9

	ASCII Text	x
	Scott Ollivierre, Adam B. Kinsman, Nicola Nicolici, "Compressed Embedded Diagnosis of Logic Cores," Computer Design, International Conference on, pp. 534-539, 2004 IEEE International Conference on Computer Design (ICCD'04), 2004.

	BibTex	x
	@article{ 10.1109/ICCD.2004.1347973, author = {Scott Ollivierre and Adam B. Kinsman and Nicola Nicolici}, title = {Compressed Embedded Diagnosis of Logic Cores}, journal ={Computer Design, International Conference on}, volume = {0}, year = {2004}, issn = {1063-6404}, pages = {534-539}, doi = {http://doi.ieeecomputersociety.org/10.1109/ICCD.2004.1347973}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Computer Design, International Conference on TI - Compressed Embedded Diagnosis of Logic Cores SN - 1063-6404 SP534 EP539 A1 - Scott Ollivierre, A1 - Adam B. Kinsman, A1 - Nicola Nicolici, PY - 2004 KW - Built-In Diagnosis KW - Test Data Compression VL - 0 JA - Computer Design, International Conference on ER -

Scott Ollivierre, McMaster University, ON, Canada

Adam B. Kinsman, McMaster University, ON, Canada

Nicola Nicolici, McMaster University, ON, Canada

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICCD.2004.1347973

This paper introduces a new method for deterministic diagnosis of logic cores. The proposed method is based on on-chip decompression and comparison of incompletely specified test patterns and test responses. Using experimental data, the trade-offs between the number of tester channels, on-chip area and scan time are discussed.

Index Terms:

Built-In Diagnosis, Test Data Compression

Citation:

Scott Ollivierre, Adam B. Kinsman, Nicola Nicolici, "Compressed Embedded Diagnosis of Logic Cores," iccd, pp.534-539, 2004 IEEE International Conference on Computer Design (ICCD'04), 2004

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