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2004 IEEE International Conference on Computer Design (ICCD'04)
Quality Improvement Methods for System-Level Stimuli Generation
San Jose, CA
October 11-October 13
ISBN: 0-7695-2231-9
Roy Emek, Haifa University Campus, Israel
Itai Jaeger, Haifa University Campus, Israel
Yoav Katz, Haifa University Campus, Israel
Yehuda Naveh, Haifa University Campus, Israel
Functional verification of systems is aimed at validating the integration of previously verified components. It deals with complex designs, and invariably suffers from scarce resources. We present a set of methods, collectively known as testing knowledge, aimed at increasing the quality of automatically generated system-level test-cases. Testing knowledge reduces the time and effort required to achieve high coverage of the verified design.
Citation:
Roy Emek, Itai Jaeger, Yoav Katz, Yehuda Naveh, "Quality Improvement Methods for System-Level Stimuli Generation," iccd, pp.204-206, 2004 IEEE International Conference on Computer Design (ICCD'04), 2004
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