Reduction in test power is important to improve battery life in portable devices employing periodic self-test, to increase reliability of testing and to reduce test-cost. In scan-based testing, about 80% of total test power is dissipated in the combinational block. In this paper, we present a novel circuit technique to virtually eliminate test power dissipation in combinational logic by masking signal transition at the logic inputs during scan shifting. We realize the masking effect by inserting an extra supply gating transistor in the VDD to GND path for the first level cells at output of the scan flops. The supply gating transistor is turned off in the scan-in mode, essentially gating the supply. Adding an extra transistor in only one logic level renders significant advantage with respect to area, delay and power (in normal mode of operation) overhead compared to existing methods, which use gating logic at the output of scan flops. Simulation results on ISCAS89 benchmarks show upto 79% improvement in area, upto 32% in power (in normal mode) and upto 7% in delay compared to lowest-cost known alternative.