A Method to Find Don?t Care Values in Test Sequences for Sequential Circuits

I
ICCD
2003
2003 IEEE International Conference on Computer Design (ICCD'03)
Abstract - A Method to Find Don?t Care Values in Test Sequences for Sequential Circuits

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2003 IEEE International Conference on Computer Design (ICCD'03)

San Jose, California

October 13-October 15

ISBN: 0-7695-2025-1

	ASCII Text	x
	Yoshinobu Higami, Shin-ya Kobayashi, Yuzo Takamatsu, Seiji Kajihara, Irith Pomeranz, "A Method to Find Don?t Care Values in Test Sequences for Sequential Circuits," Computer Design, International Conference on, pp. 397, 2003 IEEE International Conference on Computer Design (ICCD'03), 2003.

	BibTex	x
	@article{ 10.1109/ICCD.2003.1240927, author = {Yoshinobu Higami and Shin-ya Kobayashi and Yuzo Takamatsu and Seiji Kajihara and Irith Pomeranz}, title = {A Method to Find Don?t Care Values in Test Sequences for Sequential Circuits}, journal ={Computer Design, International Conference on}, volume = {0}, year = {2003}, issn = {1063-6404}, pages = {397}, doi = {http://doi.ieeecomputersociety.org/10.1109/ICCD.2003.1240927}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Computer Design, International Conference on TI - A Method to Find Don?t Care Values in Test Sequences for Sequential Circuits SN - 1063-6404 SP EP A1 - Yoshinobu Higami, A1 - Shin-ya Kobayashi, A1 - Yuzo Takamatsu, A1 - Seiji Kajihara, A1 - Irith Pomeranz, PY - 2003 KW - null VL - 0 JA - Computer Design, International Conference on ER -

Yoshinobu Higami, Ehime University

Shin-ya Kobayashi, Ehime University

Yuzo Takamatsu, Ehime University

Seiji Kajihara, Kyusyu Institute of Technology

Irith Pomeranz, Purdue University

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICCD.2003.1240927

In this paper, we propose a method to find don't care (X) values in a test sequence for a sequential circuit. Given a fully specified test sequence generated by a sequential ATPG, the proposed method produces a test sequence containing Xs without losing stuck-at fault coverage of the original test sequence.

Citation:

Yoshinobu Higami, Shin-ya Kobayashi, Yuzo Takamatsu, Seiji Kajihara, Irith Pomeranz, "A Method to Find Don?t Care Values in Test Sequences for Sequential Circuits," iccd, pp.397, 2003 IEEE International Conference on Computer Design (ICCD'03), 2003

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