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2003 IEEE International Conference on Computer Design (ICCD'03)
Multiple Fault Diagnosis Using n-Detection Tests
San Jose, California
October 13-October 15
ISBN: 0-7695-2025-1
ASCII Text
x 
 
Zhiyuan Wang, Malgorzata Marek-Sadowska, Kun-Han Tsai, Janusz Rajski, "Multiple Fault Diagnosis Using n-Detection Tests," Computer Design, International Conference on, pp. 198, 2003 IEEE International Conference on Computer Design (ICCD'03), 2003.
 
 
BibTex
x
 
@article{ 10.1109/ICCD.2003.1240895,
author = {Zhiyuan Wang and Malgorzata Marek-Sadowska and Kun-Han Tsai and Janusz Rajski},
title = {Multiple Fault Diagnosis Using n-Detection Tests},
journal ={Computer Design, International Conference on},
volume = {0},
year = {2003},
issn = {1063-6404},
pages = {198},
doi = {http://doi.ieeecomputersociety.org/10.1109/ICCD.2003.1240895},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Computer Design, International Conference on
TI - Multiple Fault Diagnosis Using n-Detection Tests
SN - 1063-6404
SP
EP
A1 - Zhiyuan Wang,
A1 - Malgorzata Marek-Sadowska,
A1 - Kun-Han Tsai,
A1 - Janusz Rajski,
PY - 2003
KW - null
VL - 0
JA - Computer Design, International Conference on
ER -
 
Zhiyuan Wang, University of California, Santa Barbara
Malgorzata Marek-Sadowska, University of California, Santa Barbara
Kun-Han Tsai, Mentor Graphics Corporation, Wilsonville, OR
Janusz Rajski, Mentor Graphics Corporation, Wilsonville, OR
In this paper, we study the relationship between multiple fault diagnosability and fault detection count. Instead of developing a complex diagnostic algorithm for multiple fault behavior, we change the test sets used in test and diagnosis. This allows us to apply a simple single-fault based diagnostic algorithm, and yet achieve very good diagnosability for the failure test cases caused by multiple faults. We have verified experimentally the effectiveness of n-detection tests for multiple-fault cases and explained the results in probabilistic terms.
Citation:
Zhiyuan Wang, Malgorzata Marek-Sadowska, Kun-Han Tsai, Janusz Rajski, "Multiple Fault Diagnosis Using n-Detection Tests," iccd, pp.198, 2003 IEEE International Conference on Computer Design (ICCD'03), 2003
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