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2002 IEEE International Conference on Computer Design (ICCD'02)
On The Impact of Technology Scaling On Mixed PTL/Static Circuits
Freiburg, Germany
September 16-September 18
ISBN: 0-7695-1700-5
Geun Rae Cho, Colorado State University
Tom Chen, Hewlett Packard Co.
We present the impact of technology scaling on mixed PTL/Static circuits and compare the results with that of domino and conventional static CMOS. The state-of-the-art technologies of 0:18µm, 0:13mum, and 0:1µm were used in the study with Vdd being scaled accordingly. The benchmark suite consists of 10 circuits of varying complexities and they are actual circuits used in a state-of-the-art 64-bit microprocessor in the form of either dynamic or static CMOS circuits. The objective of this work is to determine how performance and power consumption scales with technology scaling. Our experimental results show that mixed PTL/Static circuit style is a promising alternative in power and power-delay product while achieving comparable delay to the dynamic circuit style.
Citation:
Geun Rae Cho, Tom Chen, "On The Impact of Technology Scaling On Mixed PTL/Static Circuits," iccd, pp.322, 2002 IEEE International Conference on Computer Design (ICCD'02), 2002
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