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2002 IEEE International Conference on Computer Design (ICCD'02)
On the Detectability of Parametric Faults in Analog Circuits
Freiburg, Germany
September 16-September 18
ISBN: 0-7695-1700-5
ASCII Text
x 
 
Jacob Savir, Zhen Guo, "On the Detectability of Parametric Faults in Analog Circuits," Computer Design, International Conference on, pp. 273, 2002 IEEE International Conference on Computer Design (ICCD'02), 2002.
 
 
BibTex
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@article{ 10.1109/ICCD.2002.1106781,
author = {Jacob Savir and Zhen Guo},
title = {On the Detectability of Parametric Faults in Analog Circuits},
journal ={Computer Design, International Conference on},
volume = {0},
year = {2002},
issn = {1063-6404},
pages = {273},
doi = {http://doi.ieeecomputersociety.org/10.1109/ICCD.2002.1106781},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Computer Design, International Conference on
TI - On the Detectability of Parametric Faults in Analog Circuits
SN - 1063-6404
SP
EP
A1 - Jacob Savir,
A1 - Zhen Guo,
PY - 2002
KW - null
VL - 0
JA - Computer Design, International Conference on
ER -
 
Jacob Savir, New Jersey Institute Of Technology
Zhen Guo, New Jersey Institute Of Technology
This paper investigates the detectability of parameter faults in linear, time-invariant, analog circuits. We show that there are inherent limitations with regard to analog faults detectability.
Citation:
Jacob Savir, Zhen Guo, "On the Detectability of Parametric Faults in Analog Circuits," iccd, pp.273, 2002 IEEE International Conference on Computer Design (ICCD'02), 2002
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