On Detecting Bridges Causing Timing Failures

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1999 IEEE International Conference on Computer Design (ICCD'99)

Austin, Texas

October 10-October 13

ISBN: 0-7695-0406-X

	ASCII Text	x
	Sreenivas Mandava, Sreejit Chakravarty, Sandip Kundu, "On Detecting Bridges Causing Timing Failures," Computer Design, International Conference on, pp. 400, 1999 IEEE International Conference on Computer Design (ICCD'99), 1999.

	BibTex	x
	@article{ 10.1109/ICCD.1999.808573, author = {Sreenivas Mandava and Sreejit Chakravarty and Sandip Kundu}, title = {On Detecting Bridges Causing Timing Failures}, journal ={Computer Design, International Conference on}, volume = {0}, year = {1999}, issn = {1063-6404}, pages = {400}, doi = {http://doi.ieeecomputersociety.org/10.1109/ICCD.1999.808573}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Computer Design, International Conference on TI - On Detecting Bridges Causing Timing Failures SN - 1063-6404 SP EP A1 - Sreenivas Mandava, A1 - Sreejit Chakravarty, A1 - Sandip Kundu, PY - 1999 KW - At-Speed Testing KW - Delay Test KW - Low Voltage Testing KW - Resistive Bridges KW - Timing Failures KW - Transition Fault Model VL - 0 JA - Computer Design, International Conference on ER -

Sreenivas Mandava, Intel Corporation

Sreejit Chakravarty, Intel Corporation

Sandip Kundu, Intel Corporation

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICCD.1999.808573

High resistance bridges (resistive bridges) are becoming more common. Such bridges cause speed failures. Published experimental results show that current tests are not good at detecting such defects.The following results, pertinent to resolving the above issue, are presented: mechanisms by which bridges cause speed failure; identification of non-classical transition tests for such bridges; and the usefulness and pitfalls of using low voltage testing to detect such bridges.

Index Terms:

At-Speed Testing, Delay Test, Low Voltage Testing, Resistive Bridges, Timing Failures, Transition Fault Model

Citation:

Sreenivas Mandava, Sreejit Chakravarty, Sandip Kundu, "On Detecting Bridges Causing Timing Failures," iccd, pp.400, 1999 IEEE International Conference on Computer Design (ICCD'99), 1999

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